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Characterization of organic thin films (Materials characterization series)


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CODE: MP-B0000022

Price: US$ 72.95
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Yale Strausser,Gary E. McGuire
Momentum Press, 2010
Total Pages: 296

Table of Content

Preface to the reissue of the materials characterization series
Preface to series
Preface to the reissue of characterization of organic thin films
Part I: Preparation and materials
1. Langmuir–blodgett films
George L. Gaines, Jr.
2. Self-assembled monolayers
Abraham Ulman
Part II: Analysis of film and surface properties
4. Infrared spectroscopy in the characterization of organic thin films
David L. Allara
5. Raman spectroscopic characterization of organic thin films
Jeanne E. Pemberton
6. Surface potential
Stephen D. Evans
7. X-ray diffraction
P. Dutta
8. High resolution EELS studies of organic thin films and surfaces
Lawrence H. Dubois
9. Wetting
D. Li and A. W. Neumann
10. Secondary ion mass spectrometry as applied to thin organic and polymeric films
Jian-Xin Li, Robert W. Johnson, Jr. and Joseph A. Gardella, Jr.
11. X-ray photoelectron spectroscopy of organic thin films
Abraham Ulman and James F. Elfman
12. Molecular orientation in thin films as probed by optical second harmonic generation
Rrobert M. Corn and Daniel A. Higgins
Appendix: technique summaries
1. Auger electron spectroscopy (AES)*
2. Dynamic secondary ion mass spectrometry (D-SIMS)*
3. Fourier transform infrared spectroscopy (FTIR)*
4. High resolution electron energy loss spectroscopy (HREELS)*
5. Low-energy electron diffraction (LEED)*
6. Raman spectroscopy*
7. Scanning electron microscopy (SEM)*
8. Scanning tunneling microscopy and scanning force microscopy (STM and SFM)*
9. Static secondary ion mass spectrometry (Static SIMS)*
10. Transmission electron microscopy (TEM)*
11. Variable-angle spectroscopic ellipsometry (VASE)*
12. X-ray diffraction (XRD)*
13. X-ray fluorescence (XRF)*
14. X-ray photoelectron spectroscopy (XPS)*