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Characterization of catalytic materials (Materials characterization series)


MP-B0000016

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CODE: MP-B0000016

Price: US$ 72.95
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Israel E. Wachs
1606501844,1606501860,9781606501849,9781606501863
Momentum Press, 2010
Total Pages: 220

Table of Content

Preface to the reissue of the materials characterization series
Preface to series
Preface to the reissue of characterization of catalytic material
Preface
Contributors
1. Bulk metals and alloys
Johannes Schwank
2. Supported metals
George Meitzner
3. Bulk metal oxides
James F. Brazdil
4. Supported metal oxides
Israel E. Wachs and Kohichi Segawa
5. Bulk metal sulfides
Michel Daage
6. Supported metal sulfides
Roel Prins
7. Zeolites and molecular sieves
Mark E. Davis and John B. Higgins
8. Alumina pillared clays: methods of preparation and characterization
Jean-Remi Butruille and Thomas J. Pinnavaia
Appendix: technique summaries
1. Auger electron spectroscopy (AES)*
2. Dynamic secondary ion mass spectrometry (D-SIMS)*
3. Electron energy-loss spectroscopy in the transmission electron microscope (EELS)*
4. Electron paramagnetic resonance/electron spin resonance
5. Electron microprobe x-ray microanalysis (EPMA)*
6. Energy-dispersive x-ray spectroscopy (EDS)*
7. Extended x-ray absorption fine structure (EXAFS)*
8. Fourier transform infrared spectroscopy (FTIR)*
9. High resolution electron energy loss spectroscopy (HREELS)*
10. Inductively coupled plasma mass spectrometry (ICPMS)*
11. Inductively coupled plasma-optical emission spectroscopy (ICP-OES)*
12. Ion scattering spectroscopy (ISS)*
13. Low-energy electron diffraction (LEED)*
14. Mossbauer spectroscopy
15. Neutron activation analysis (NAA)*
16. Neutron diffraction*
17. Physical and chemical adsorption for the measurement of solid surface areas*
18. Raman spectroscopy*
19. Scanning electron microscopy (SEM)*
20. Scanning transmission electron microscopy (STEM)*
21. Scanning tunneling microscopy and scanning force microscopy (STM and SFM)*
22. Solid state nuclear magnetic resonance (NMR)*
23. Static secondary ion mass spectrometry (Static SIMS)*
24. Temperature programmed techniques
25. Transmission electron microscopy (TEM)*
26. Ultraviolet photoelectron spectroscopy (UPS)*
27. X-ray diffraction (XRD)*
28. X-ray fluorescence (XRF)*
29. X-ray photoelectron and auger electron diffraction (XRD and AED)*
30. X-ray photoelectron spectroscopy (XPS)*
Index
  
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