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Characterization of ceramics (Materials characterization series)


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CODE: MP-B0000008

Price: US$ 72.95
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Ronald E. Loehman
Momentum Press, 1993
Total Pages: 316

Table of Content

Preface to the reissue of the materials characterization series
Preface to series
Preface to the reissue of characterization of ceramics
1. Powder and precursor preparation by solution techniques
James A. Voigt
2. Powder preparation by gas-phase techniques
Carol L. Jones Adkins
3. Formation of ceramic films and coatings
Diane E. Peebles
4. Consolidation of ceramic thick films
Terry J. Garino
5. Consolidation of bulk ceramics
Kevin G. Ewsuk
6. Inorganic glasses and glass-ceramics
Richard K. Brow
7. Ceramic microstructures
Altaf H. Carim
8. Ceramic reactions and phase behavior
Patrick K. Gallagher
9. Mechanical properties and fracture
Edwin K. Beauchamp
10. Ceramic composites
S. Jill Glass and Rajan Tandon
11. Glass and ceramic joints
Antoni P. Tomsia and Ronald E. Loehman
12. Electronic and magnetic ceramics
Robert W. Schwartz
13. Nondestructive evaluation
Lynn Neergaard
Appendix: technique summaries
1. Auger electron spectroscopy (AES)
2. Electron energy-loss spectroscopy in the transmission electron microscope (EELS)
3. Electron microprobe x-ray microanalysis (EPMA)
4. Energy-dispersive x-ray spectroscopy (EDS)
5. Fourier transform infrared spectroscopy (FTIR)
6. Light microscopy
7. Neutron diffraction
8. Physical and chemical adsorption for the measurement of solid surface areas
9. Raman spectroscopy
10. Rutherford backscattering spectrometry (RBS)
11. Scanning electron microscopy (SEM)
12. Scanning transmission electron microscopy (STEM)
13. Scanning tunneling microscopy and scanning force microscopy (STM and SFM)
14. Solid state nuclear magnetic resonance (NMR)
15. Surface roughness: measurement, formation by sputtering, impact on depth profiling
16. Transmission electron microscopy (TEM)
17. Variable-angle spectroscopic ellipsometry (VASE)
18. X-ray diffraction (XRD)
19. X-ray fluorescence (XRF)
20. X-ray photoelectron spectroscopy (XPS)