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Characterization of optical materials (Materials characterization series)


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CODE: MP-B0000003

Price: US$ 72.95
1 (this product is electronically distributed)

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Gregory J. Exarhos
Momentum Press, 1993
Total Pages: 228

Table of Content

Preface to the reissue of the materials characterization series
Preface to series
Preface to the reissue of characterization of optical materials
Gregory J. Exarhos
Part I: Influence of surface morphology and microstructure on optical response
1. Characterization of surface roughness
Jean M. Bennett
2. Characterization of the near-surface region using polarization-sensitive optical techniques
Gerald E. Jellison, Jr
3. The composition, stoichiometry, and related microstructure of optical materials
Robert J. Nemanich and Trevor P. Humphreys
4. Diamond as an optical material
Albert Feldman, L. H. Robins, E. N. Farabaugh and D. Shectman
Part II: Stability and modification of film and surface optical properties
5. Multilayer optical coatings
peter m. martin
6. Characterization and control of stress in optical films
Bradley J. Pond
7. Surface modifi cation of optical materials
Carl J. Mchargue
8. Laser-induced damage to optical materials
Michael F. Becker
Appendix: technique summaries
1. Auger electron spectroscopy (AES)
2. Cathodoluminescence (CL)
3. Electron energy-loss spectroscopy in the transmission electron microscope (EELS)
4. Energy-dispersive x-ray spectroscopy (EDS)
5. Fourier transform infrared spectroscopy (FTIR)
6. Light microscopy
7. Modulation spectroscopy
8. Nuclear reaction analysis (NRA)
9. Optical scatterometry
10. Photoluminescence (PL)
11. Photothermal displacement technique
12. Raman spectroscopy
13. Rutherford backscattering spectrometry (RBS)
14. Scanning electron microscopy (SEM)
15. Scanning transmission electron microscopy (STEM)
16. Scanning tunneling microscopy and scanning force microscopy (STM and SFM)
17. Static secondary ion mass spectrometry (Static SIMS)
18. Surface roughness: measurement, formation by sputtering, impact on depth profiling
19. Total internal reflection microscopy
20. Transmission electron microscopy (TEM)
21. Variable-angle spectroscopic ellipsometry (VASE)
22. X-ray diffraction (XRD)
23. X-ray fluorescence (XRF)
24. X-ray photoelectron spectroscopy (XPS)